Abstract:
We present a frequency-selective surfaces (FSS) transparent window exhibiting low losses for broadband spectroscopic and imaging measurements in terahertz (THz) frequenci...Show MoreMetadata
Abstract:
We present a frequency-selective surfaces (FSS) transparent window exhibiting low losses for broadband spectroscopic and imaging measurements in terahertz (THz) frequencies. The intent is to replace existing samples holders (e.g., Z-cut crystal quartz) with transparent metamaterial windows and increase measurement sensitivity. To enable multiband and broadband responses, two designs of single-layer FSS with superstrate are demonstrated: circular slot and double square loop, and thus suppress losses in a given range of THz band.
Published in: IEEE Transactions on Terahertz Science and Technology ( Volume: 5, Issue: 1, January 2015)
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- IEEE Keywords
- Index Terms
- Spectroscopy Measurements ,
- Imaging Measurements ,
- Transparency Window ,
- Double Loop ,
- Frequency Selective Surface ,
- Broadband Response ,
- Circular Loop ,
- Refractive Index ,
- Time Domain ,
- Fast Fourier Transform ,
- Periodic Boundary Conditions ,
- Incident Angle ,
- Power Loss ,
- Sample Holder ,
- Reflection Coefficient ,
- Transmission Coefficient ,
- Reference Signal ,
- Normal Incidence ,
- Impedance Matching ,
- Terahertz Imaging ,
- Terahertz Time-domain Spectroscopy ,
- Incident Angle Increases ,
- Terahertz Spectroscopy ,
- Unit Cell Dimensions ,
- Normal Angle ,
- Metal Thickness ,
- Substrate Thickness ,
- Sample Index ,
- Design Parameters
- Author Keywords
Contents Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Spectroscopy Measurements ,
- Imaging Measurements ,
- Transparency Window ,
- Double Loop ,
- Frequency Selective Surface ,
- Broadband Response ,
- Circular Loop ,
- Refractive Index ,
- Time Domain ,
- Fast Fourier Transform ,
- Periodic Boundary Conditions ,
- Incident Angle ,
- Power Loss ,
- Sample Holder ,
- Reflection Coefficient ,
- Transmission Coefficient ,
- Reference Signal ,
- Normal Incidence ,
- Impedance Matching ,
- Terahertz Imaging ,
- Terahertz Time-domain Spectroscopy ,
- Incident Angle Increases ,
- Terahertz Spectroscopy ,
- Unit Cell Dimensions ,
- Normal Angle ,
- Metal Thickness ,
- Substrate Thickness ,
- Sample Index ,
- Design Parameters
- Author Keywords
