Abstract:
TID test method and results for CMOS SOI PowerPC7884 microprocessor in gamma-rays are presented. Significant influence of bias conditions and functional test procedure on...Show MoreMetadata
Abstract:
TID test method and results for CMOS SOI PowerPC7884 microprocessor in gamma-rays are presented. Significant influence of bias conditions and functional test procedure on resulting TID tolerance level is noted.
Published in: 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
Date of Conference: 23-27 September 2013
Date Added to IEEE Xplore: 30 October 2014
Electronic ISBN:978-1-4673-5057-0
Contents 