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Calculating material criticality of transparent conductive electrodes used for thin film and third generation solar cells | IEEE Conference Publication | IEEE Xplore

Calculating material criticality of transparent conductive electrodes used for thin film and third generation solar cells


Abstract:

The supply risk and exposure to supply shortage is becoming an important factor in the consideration of a mass low carbon technology roll-out. This study takes current cr...Show More

Abstract:

The supply risk and exposure to supply shortage is becoming an important factor in the consideration of a mass low carbon technology roll-out. This study takes current criticality studies, which analyse the criticality of single raw materials, and extends it to calculate the relative criticality of multiple material transparent conductive electrodes (TCE). It compares the calculated criticality with the TCE's Haacke figure of merit. It is found that more recent TCEs developed to replace the commonly used indium tin oxide, such as flurine doped tin oxide and silver nanowires, can have a higher criticality, even though the materials themselves are currently less expensive.
Date of Conference: 08-13 June 2014
Date Added to IEEE Xplore: 16 October 2014
ISBN Information:
Print ISSN: 0160-8371
Conference Location: Denver, CO, USA

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