Sanitizing and Minimizing Databases for Software Application Test Outsourcing | IEEE Conference Publication | IEEE Xplore

Sanitizing and Minimizing Databases for Software Application Test Outsourcing


Abstract:

Testing software applications that use nontrivial databases is increasingly outsourced to test centers in order to achieve lower cost and higher quality. Not only do diff...Show More

Abstract:

Testing software applications that use nontrivial databases is increasingly outsourced to test centers in order to achieve lower cost and higher quality. Not only do different data privacy laws prevent organizations from sharing this data with test centers because databases contain sensitive information, but also this situation is aggravated by big data - it is time consuming and difficult to anonymize, distribute, and test with large databases. Deleting data randomly often leads to significantly worsened test coverages and fewer uncovered faults, thereby reducing the quality of software applications. We propose a novel approach for Protecting and mInimizing databases for Software TestIng taSks (PISTIS) that both sanitizes and minimizes a database that comes along with an application. PISTIS uses a weight-based data clustering algorithm that partitions data in the database using information obtained using program analysis that describes how this data is used by the application. For each cluster, a centroid object is computed that represents different persons or entities in the cluster, and we use associative rule mining to compute and use constraints to ensure that the centroid objects are representative of the general population of the data in the cluster. Doing so also sanitizes information, since these centroid objects replace the original data to make it difficult for attackers to infer sensitive information. Thus, we reduce a large database to a few centroid objects and we show in our experiments with two applications that test coverage stays within a close range to its original level.
Date of Conference: 31 March 2014 - 04 April 2014
Date Added to IEEE Xplore: 02 June 2014
Electronic ISBN:978-1-4799-2255-0
Print ISSN: 2159-4848
Conference Location: Cleveland, OH, USA

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