Abstract:
In nanoscale digital CMOS IC design, the large technology parameter variations have boosted the interest in statistical performance analysis. As the huge execution time o...Show MoreMetadata
Abstract:
In nanoscale digital CMOS IC design, the large technology parameter variations have boosted the interest in statistical performance analysis. As the huge execution time of SPICE-based transistor-level Monte Carlo analysis is impractical for complex designs, there is a need for making accurate Monte Carlo analysis feasible through fast logic-level simulators. This paper presents a new, general logic model of digital CMOS cells featuring technology variation aware timing, and its prototype implementation in a standard hardware-description-language environment. The application of the approach to typical standard cells and test circuits shows very good agreement with SPICE BSIM4 transistor-level simulation both for nominal delay and for statistical Monte Carlo analyses.
Published in: IEEE Transactions on Very Large Scale Integration (VLSI) Systems ( Volume: 22, Issue: 6, June 2014)
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- IEEE Keywords
- Index Terms
- Propagation Delay ,
- Paradigmatic Model ,
- Monte Carlo Simulation ,
- Logic Model ,
- Technological Parameters ,
- Statistical Analysis Of Performance ,
- Statistical Models ,
- Capacitance Values ,
- Inverter ,
- Pairs Of Values ,
- Static Analysis ,
- Global Variables ,
- Circuit Activity ,
- Parasitic Capacitance ,
- Inductive Load ,
- Cell Library ,
- Vertical Shift ,
- Equivalent Capacitance ,
- Monte Carlo Iterations ,
- Input Capacitance ,
- Logic Level ,
- Cell Path ,
- Electronic Design Automation ,
- Circuit Size ,
- SPICE Simulations ,
- Logic Elements ,
- Boolean Logic ,
- Input Signal ,
- Capacitance Model ,
- Target Cells
- Author Keywords
- Author Free Keywords
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Propagation Delay ,
- Paradigmatic Model ,
- Monte Carlo Simulation ,
- Logic Model ,
- Technological Parameters ,
- Statistical Analysis Of Performance ,
- Statistical Models ,
- Capacitance Values ,
- Inverter ,
- Pairs Of Values ,
- Static Analysis ,
- Global Variables ,
- Circuit Activity ,
- Parasitic Capacitance ,
- Inductive Load ,
- Cell Library ,
- Vertical Shift ,
- Equivalent Capacitance ,
- Monte Carlo Iterations ,
- Input Capacitance ,
- Logic Level ,
- Cell Path ,
- Electronic Design Automation ,
- Circuit Size ,
- SPICE Simulations ,
- Logic Elements ,
- Boolean Logic ,
- Input Signal ,
- Capacitance Model ,
- Target Cells
- Author Keywords
- Author Free Keywords