Abstract:
We have fabricated ultrafast dark count-free soft X-ray single-photon detectors (X-SNSPDs) from TaN with various conduction path widths, and we compare their properties w...Show MoreMetadata
Abstract:
We have fabricated ultrafast dark count-free soft X-ray single-photon detectors (X-SNSPDs) from TaN with various conduction path widths, and we compare their properties with corresponding data from a Nb X-SNSPD. The TaN X-SNSPDs offer an improved detector performance regarding device detection efficiency, latching, and pulse amplitudes. Wide conduction paths allow for a certain energy-resolving capability in contrast to narrow TaN conduction paths. However, wide paths also limit the detection efficiency at low temperatures, which can be explained within a hot-spot model.
Published in: IEEE Transactions on Applied Superconductivity ( Volume: 23, Issue: 3, June 2013)
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Soft X-ray ,
- Single-photon Detectors ,
- Niobium ,
- Tantalum Nitride ,
- Pulse Amplitude ,
- Conductive Path ,
- Impedance ,
- Film Thickness ,
- Signal Amplitude ,
- Penetration Depth ,
- Acceleration Voltage ,
- X-ray Source ,
- Critical Temperature ,
- Count Rate ,
- Critical Current ,
- Amplitude Distribution ,
- Bias Current ,
- Photon Detection ,
- Dark Count ,
- keV Photon ,
- Dark Count Rate
- Author Keywords
Contents Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Soft X-ray ,
- Single-photon Detectors ,
- Niobium ,
- Tantalum Nitride ,
- Pulse Amplitude ,
- Conductive Path ,
- Impedance ,
- Film Thickness ,
- Signal Amplitude ,
- Penetration Depth ,
- Acceleration Voltage ,
- X-ray Source ,
- Critical Temperature ,
- Count Rate ,
- Critical Current ,
- Amplitude Distribution ,
- Bias Current ,
- Photon Detection ,
- Dark Count ,
- keV Photon ,
- Dark Count Rate
- Author Keywords
