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Equipment and Test Results of the Electronic Components to SEE in the Temperature Range | IEEE Conference Publication | IEEE Xplore
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Equipment and Test Results of the Electronic Components to SEE in the Temperature Range

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Vasily S. Anashin; Alexander E. Kozyukov; Vladimir V. Emeliyanov; Alexander I. Ozerov; Alexander S. Vatuev; Alexey V. Besetskiy
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Abstract:

This paper presents SEE test facility as well as its opportunities of integrated microcircuit tests in the temperature range. The used method of heating and cooling of DU...Show More

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Abstract:

This paper presents SEE test facility as well as its opportunities of integrated microcircuit tests in the temperature range. The used method of heating and cooling of DUT was considered in vacuum chamber of test facility.
Published in: 2012 IEEE Radiation Effects Data Workshop
Date of Conference: 16-20 July 2012
Date Added to IEEE Xplore: 15 November 2012
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ISSN Information:

DOI: 10.1109/REDW.2012.6353725
Conference Location: Miami, FL, USA
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