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Exploiting high-level descriptions for circuits fault tolerance assessments | IEEE Conference Publication | IEEE Xplore

Exploiting high-level descriptions for circuits fault tolerance assessments


Abstract:

The paper proposes a new approach to estimate early the fault detection capability of a safety-critical computer-based system from its high-level description. This paper ...Show More

Abstract:

The paper proposes a new approach to estimate early the fault detection capability of a safety-critical computer-based system from its high-level description. This paper first aims at verifying the correspondence between dependability measures obtained through simulation-based fault injection experiments at different levels of abstraction. Then, we propose Alternative Graphs (AGs) to create lists of malicious faults without expanding the full data flow, whose size can often explode. Fault trees are exploited to improve the results of the high-level fault analysis. To evaluate the effectiveness of the approach, simulation-based fault injection experiments have been done on some benchmark systems described in VHDL language. The approach demonstrates that fault detection analysis performed at a high-level is less CPU time demanding but approximates well the fault detection measures achievable on a low-level system description.
Date of Conference: 20-22 October 1997
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-8186-8168-3
Print ISSN: 1550-5774
Conference Location: Paris, France

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