Abstract:
In this paper it is shown experimentally how the shape and the amount of the carrier distribution in the middle region of a diode influences the static behavior (voltage-...Show MoreMetadata
Abstract:
In this paper it is shown experimentally how the shape and the amount of the carrier distribution in the middle region of a diode influences the static behavior (voltage-current characteristic), the dynamic behavior (reverse recovery current, reverse recovery charge, soft recovery) and the temperature dependence of these characteristics. By combining the lifetime dominated Hall-principle and the emitter-controlling Kleinmann-principle various diodes were manufactured and investigated. With an infrared absorption technique the corresponding carrier distributions were measured.
Date of Conference: 26-29 May 1997
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-7803-3993-2
Print ISSN: 1063-6854