Abstract:
A diagnostic test generation system for computing I/sub DQQ/ diagnostic test sets for bridging faults in combinational circuits is presented. The system uses fault sampli...Show MoreMetadata
Abstract:
A diagnostic test generation system for computing I/sub DQQ/ diagnostic test sets for bridging faults in combinational circuits is presented. The system uses fault sampling. Experimental results presented show that fault sampling is a very effective method for computing diagnostic test sets, especially when the number of target faults is very large.
Date of Conference: 27 April 1997 - 01 May 1997
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-8186-7810-0
Print ISSN: 1093-0167
