I. Motivation
In the steady state of a charge pump PLL, the divide and reference edges align and the charge pump current should ideally be zero. In reality, due to circuit nonidealities like charge pump current mismatch, loop filter leakage, and feedthrough of the charge pump switches, a nonzero current which is periodic at the reference frequency is injected into the loop filter as shown in Fig. 1. This generates a periodic disturbance on the control voltage and manifests itself as a reference spur at the PLL output. The additional VCO output phase noise spectrum due to the charge pump noise can be expressed in dBc as [1] S_{\phi} (f)=10\log \left (S_{\rm cp} (f){\left \vert {{{Z (f)\,K_{\rm vco}}\over {f}}}\right \vert}^{2}\right)\eqno{\hbox{(1)}} where is the PSD of . When is periodic at , (and hence ) consists of impulses, or spurs, at integer multiples of . To reduce spurs, the product has to be reduced. This implies a proportionally smaller bandwidth for a given loop stability margin. Several techniques [2]–[6] have been proposed to address this problem of spur magnitude and bandwidth trade-off. Reference [2] addresses the issue based on the technique of delay-sampling the control voltage. But this technique is not effective in the presence of loop filter capacitor leakage. Reference [3] minimizes the charge pump mismatch thereby reducing the spur, at the cost of increased settling time. Reference [4] uses distributed charge pump and phase frequency detector (PFD) with pulse position randomization to reduce the spur. Using distributed PFD and charge pumps can cause the total size of the charge pump switches to be larger, increasing the net feedthrough error besides an increase in implementation complexity.
The standard charge pump PLL architecture showing the periodic charge pump current in steady state.