Thermal expansion coefficient and compressibility of single crystal silicon | IEEE Conference Publication | IEEE Xplore

Thermal expansion coefficient and compressibility of single crystal silicon


Abstract:

Accurately known values of material properties for single crystals of silicon are necessary, to apply corrections in a planned high precision determination of Avogadro's ...Show More

Abstract:

Accurately known values of material properties for single crystals of silicon are necessary, to apply corrections in a planned high precision determination of Avogadro's constant. Measurements of the coefficient of thermal expansion and of the compressibility of silicon are performed by interferometry in the range from vacuum to atmospheric pressure and from 15/spl deg/C to 25/spl deg/C.
Date of Conference: 17-21 June 1996
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-7803-3376-4
Conference Location: Braunschweig, Germany

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