Measurement of Dielectric Constant of Some Materials Using Planar Technology | IEEE Conference Publication | IEEE Xplore

Measurement of Dielectric Constant of Some Materials Using Planar Technology


Abstract:

For proper design of microwave components, such as filters, oscillators, mixers, and other microwave devices, the dielectric constant of the substrate must be known. Ther...Show More

Abstract:

For proper design of microwave components, such as filters, oscillators, mixers, and other microwave devices, the dielectric constant of the substrate must be known. Therefore, the main aim of this paper is to measure the dielectric constant of some Libyan materials, such as plastic and clay, to find out if they can be used as raw materials for many microwave devices that can be designed in the future. The measurements were done using two different methods, the microstrip ring resonator method and the two-layer stripline method. The paper includes the necessary designs of ring resonator, and the microstrip line, which were used in the measurements. A good result for the measurement of a dielectric constant of the material is obtained compared to the similar materials in the open literature.
Date of Conference: 28-30 December 2009
Date Added to IEEE Xplore: 15 January 2010
ISBN Information:
Conference Location: Dubai, United Arab Emirates

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