Automatic Test Data Generation for Multiple Condition and MCDC Coverage | IEEE Conference Publication | IEEE Xplore

Automatic Test Data Generation for Multiple Condition and MCDC Coverage


Abstract:

Recently search based software engineering (SBSE) has evolved as a major research field in the software engineering community. SBSE has been applied successfully to many ...Show More

Abstract:

Recently search based software engineering (SBSE) has evolved as a major research field in the software engineering community. SBSE has been applied successfully to many software engineering activities ranging from requirement engineering to software maintenance and quality assessment. One area where SBSE has seen much application is test data generation. Search based test data generation techniques have been applied to automatically generate data for testing functional and non-functional properties of softwares. For structural testing, most of the time, the criterion used, is branch coverage. However, this is not enough. For the wider acceptance of search based test data generation techniques, much stronger criteria are needed. In this paper we have proposed an automatic framework that extend search based testing techniques to more stronger criteria such as multiple condition and MCDC coverage.
Date of Conference: 20-25 September 2009
Date Added to IEEE Xplore: 30 October 2009
ISBN Information:
Conference Location: Porto, Portugal

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