Abstract:
The NAND tree structures used in some semiconductor test methods have been used in board test environments as a simple test for open input and bidirectional pins. The tes...Show MoreMetadata
Abstract:
The NAND tree structures used in some semiconductor test methods have been used in board test environments as a simple test for open input and bidirectional pins. The test methods used at semiconductor test time have an unfortunate problem when used at board test: they give an incorrect diagnosis. A new test procedure is described that avoids this problem.
Published in: Proceedings., International Test Conference
Date of Conference: 02 October 1995 - 06 October 1994
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-7803-2103-0
Print ISSN: 1089-3539
