Abstract:
The typical personal computer of today is used more and more to perform functions and run application programs that are critical to a business's success. One of the bigge...Show MoreMetadata
Abstract:
The typical personal computer of today is used more and more to perform functions and run application programs that are critical to a business's success. One of the biggest problems that inhibits productivity in this environment Is the effect of a lock-up, crash or parity error caused by cosmic-ray radiation-induced soft errors in the DRAM chips. IBM has announced a family of plug-compatible, retrofittable SIMMs with built-in ECC to provide a solution to this problem. This paper addresses the challenges associated with the full functional test of a SIMM with on-board ECC using a very test-unfriendly industry-standard memory module interface.
Published in: Proceedings., International Test Conference
Date of Conference: 02 October 1995 - 06 October 1994
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-7803-2103-0
Print ISSN: 1089-3539
