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A review of Xilinx FPGA architectural reliability concerns from Virtex to Virtex-5 | IEEE Conference Publication | IEEE Xplore
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A review of Xilinx FPGA architectural reliability concerns from Virtex to Virtex-5

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Heather Quinn; Keith Morgan; Paul Graham; Jim Krone; Michael Caffrey
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Abstract:

This paper presents heavy ion static results for Xilinx field-programmable gate arrays (FPGAs). The paper analyzes static bit cross-sections, resources, multiplebit upset...Show More

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Abstract:

This paper presents heavy ion static results for Xilinx field-programmable gate arrays (FPGAs). The paper analyzes static bit cross-sections, resources, multiplebit upsets (MBUs) and resource effects for implications to triple-modular redundancy.
Published in: 2007 9th European Conference on Radiation and Its Effects on Components and Systems
Date of Conference: 10-14 September 2007
Date Added to IEEE Xplore: 18 August 2009
Print ISBN:978-1-4244-1704-9
Print ISSN: 0379-6566
DOI: 10.1109/RADECS.2007.5205533
Conference Location: Deauville, France
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