CMOS bridging fault detection

Metadata

First Page of the Article

Published in: 1991, Proceedings. International Test Conference

Date of Conference: 26-30 October 1991

Date Added to IEEE Xplore: 06 August 2002

Print ISBN:0-8186-9156-5

Print ISSN: 1089-3539

DOI: 10.1109/TEST.1991.519796

Conference Location: Nashville, TN, USA

First Page of the Article

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