Abstract:
Recently, many groups have reported on the occurrence of brain shift in stereotactic surgery and its impact on the procedure. A shift of deep brain structures by only a f...Show MoreMetadata
Abstract:
Recently, many groups have reported on the occurrence of brain shift in stereotactic surgery and its impact on the procedure. A shift of deep brain structures by only a few millimeters can potentially increase the number of required microelectrode and/or macroelectrode tracks. This can cause complications and potentially affect implantation accuracy. Detecting intra-operative brain shift and, more significantly correcting for it intra-operatively can thus impact the procedure and its outcome. In this study, we have used intra-operative stimulation response data to assess brain shift. Using a shift free functional atlas containing therapeutic response to stimulation (efficacy) data from a population of patients we build statistical efficacy maps on new patients. We then compare the information provided by the maps with the actual intra-operative responses of those patients to detect brain shift. Our preliminary results show that by maximizing the correlation between statistical maps and intra-operative observations, it may be possible to detect intra-operative brain shift and potentially correct for it.
Date of Conference: 28 June 2009 - 01 July 2009
Date Added to IEEE Xplore: 07 August 2009
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Dept. of Electrical Engineering & Computer Science, Vanderbilt University, Nashville, TN, USA
Dept. of Electrical Engineering & Computer Science, Vanderbilt University, Nashville, TN, USA
Department of Neurosurgery, Vanderbilt University Medical Center, Nashville, TN, USA
Dept. of Neurosurgery, Vanderbilt University Medical Center, Nashville, TN, USA
Department of Neurosurgery, Vanderbilt University Medical Center, Nashville, TN, USA
Dept. of Neurosurgery, Vanderbilt University Medical Center, Nashville, TN, USA
Department of Neurosurgery, Vanderbilt University Medical Center, Nashville, TN, USA
Dept. of Neurosurgery, Vanderbilt University Medical Center, Nashville, TN, USA
Dept. of Electrical Engineering & Computer Science, Vanderbilt University, Nashville, TN, USA
Department of Neurosurgery, Vanderbilt University Medical Center, Nashville, TN, USA
Dept. of Neurosurgery, Vanderbilt University Medical Center, Nashville, TN, USA
Dept. of Electrical Engineering & Computer Science, Vanderbilt University, Nashville, TN, USA
Dept. of Electrical Engineering & Computer Science, Vanderbilt University, Nashville, TN, USA
Dept. of Electrical Engineering & Computer Science, Vanderbilt University, Nashville, TN, USA
Department of Neurosurgery, Vanderbilt University Medical Center, Nashville, TN, USA
Dept. of Neurosurgery, Vanderbilt University Medical Center, Nashville, TN, USA
Department of Neurosurgery, Vanderbilt University Medical Center, Nashville, TN, USA
Dept. of Neurosurgery, Vanderbilt University Medical Center, Nashville, TN, USA
Department of Neurosurgery, Vanderbilt University Medical Center, Nashville, TN, USA
Dept. of Neurosurgery, Vanderbilt University Medical Center, Nashville, TN, USA
Dept. of Electrical Engineering & Computer Science, Vanderbilt University, Nashville, TN, USA
Department of Neurosurgery, Vanderbilt University Medical Center, Nashville, TN, USA
Dept. of Neurosurgery, Vanderbilt University Medical Center, Nashville, TN, USA
Dept. of Electrical Engineering & Computer Science, Vanderbilt University, Nashville, TN, USA