Tests and measurement | IEEE Journals & Magazine | IEEE Xplore

Tests and measurement


Abstract:

Fuelled by worldwide semiconductor sales, the test and measurement industry in 1995 enjoyed a year like few others in living memory. This paper presents an overview of te...Show More

Abstract:

Fuelled by worldwide semiconductor sales, the test and measurement industry in 1995 enjoyed a year like few others in living memory. This paper presents an overview of test and measurement technologies and highlights: industry searches for the best testability strategy; methods to probe dense integrated circuit boards and wafers; standard approval for a system-level test bus; and how the equipment community is tackling software testing.
Published in: IEEE Spectrum ( Volume: 33, Issue: 1, January 1996)
Page(s): 65 - 69
Date of Publication: 31 January 1996

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