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Higher-order Wavelet Statistics and their Application to Digital Forensics | IEEE Conference Publication | IEEE Xplore

Higher-order Wavelet Statistics and their Application to Digital Forensics


Abstract:

We describe a statistical model for natural images that is built upon a multi-scale wavelet decomposition. The model consists of first- and higher-order statistics that c...Show More

Abstract:

We describe a statistical model for natural images that is built upon a multi-scale wavelet decomposition. The model consists of first- and higher-order statistics that capture certain statistical regularities of natural images. We show how this model can be useful in several digital forensic applications, specifically in detecting various types of digital tampering.
Date of Conference: 16-22 June 2003
Date Added to IEEE Xplore: 12 September 2008
Print ISBN:0-7695-1900-8
Print ISSN: 1063-6919
Conference Location: Madison, WI, USA

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