Abstract:
The phase-shifting interference microscopy is combined with the multi-wavelength optical phase unwrapping to obtain quantitative phase profiles of microscopic objects wit...Show MoreMetadata
Abstract:
The phase-shifting interference microscopy is combined with the multi-wavelength optical phase unwrapping to obtain quantitative phase profiles of microscopic objects without 2π discontinuities. Due to broadband light sources, images are less affected by coherent noise.
Published in: 2007 Conference on Lasers and Electro-Optics (CLEO)
Date of Conference: 06-11 May 2007
Date Added to IEEE Xplore: 15 February 2008
CD:978-1-55752-834-6
Electronic ISSN: 2160-9004
Contents 