Abstract:
PbZr0.52Ti0.48O3 (PZT) was deposited on three substrates: Pt/Ti/SiO2/Si, PbTiO3/Pt/Ti/SiO2/Si and LaNiO3/SiO2/Si. The final PZT film morphology, orientation, piezoelectri...Show MoreMetadata
Abstract:
PbZr0.52Ti0.48O3 (PZT) was deposited on three substrates: Pt/Ti/SiO2/Si, PbTiO3/Pt/Ti/SiO2/Si and LaNiO3/SiO2/Si. The final PZT film morphology, orientation, piezoelectric and ferroelectric properties were investigated and related to the substrate type.
Date of Conference: 27-31 May 2007
Date Added to IEEE Xplore: 04 December 2007
ISBN Information: