Abstract:
This paper provides experimental details of micro-latchup occurrences in SRAM circuitry caused by exposure to neutron irradiation similar to that seen at sea level (terre...Show MoreMetadata
Abstract:
This paper provides experimental details of micro-latchup occurrences in SRAM circuitry caused by exposure to neutron irradiation similar to that seen at sea level (terrestrial neutrons). Design enhancements are identified that eliminated the problem.
Published in: 2007 IEEE Radiation Effects Data Workshop
Date of Conference: 23-27 July 2007
Date Added to IEEE Xplore: 08 October 2007
ISBN Information:
Contents 