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TPS life cycle improvements using artificial intelligence | IEEE Conference Publication | IEEE Xplore

TPS life cycle improvements using artificial intelligence


Abstract:

Test Program Sets (TPS) are a significant investment in today's complex electronics. Military and commercial services alike are currently exploring new approaches to TPSs...Show More

Abstract:

Test Program Sets (TPS) are a significant investment in today's complex electronics. Military and commercial services alike are currently exploring new approaches to TPSs. Artificial Intelligence (AI) techniques can provide significant cost and performance benefits. This paper identifies the TPS tasks across the entire life cycle, the AI techniques applicable to those tasks, and the resulting obtainable benefits.<>
Published in: AUTOTESTCON 93
Date of Conference: 20-23 September 1993
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-7803-0646-5
Conference Location: San Antonio, TX, USA

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