Abstract:
The authors propose a new method for scatter correction using two sinograms acquired simultaneously with a low and a high lower energy threshold (LLD). The high LLD is ch...Show MoreMetadata
Abstract:
The authors propose a new method for scatter correction using two sinograms acquired simultaneously with a low and a high lower energy threshold (LLD). The high LLD is chosen such that the corresponding sinogram contains no or few scatter counts. The information in each data set are combined to produce a sinogram corrected for scatter. The method is described in detail and evaluated on various phantom measurements.<>
Date of Conference: 31 October 1993 - 06 November 1993
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-7803-1487-5