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Testability of circuits derived from functional decision diagrams

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B. Becker; R. Drechsler
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Abstract:

We investigate the testability properties of Boolean networks derived from a special class of multi-level AND/EXOR expressions, called ordered functional decision diagram...Show More

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Abstract:

We investigate the testability properties of Boolean networks derived from a special class of multi-level AND/EXOR expressions, called ordered functional decision diagrams (OFDDs). We consider the stuck-at fault model (SAFM) and the cellular fault model (CFM). All occurring redundancies are classified. The resulting circuits are highly testable with nearly 100% fault coverage on average.<>
Published in: Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC
Date of Conference: 28 February 1994 - 03 March 1994
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-8186-5410-4
DOI: 10.1109/EDTC.1994.326922
Conference Location: Paris, France

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