Abstract:
IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simula...Show MoreScope:This standard covers electrical tests and performance requirements for exposed semiconducting shields on premolded cable accessories, specifically joints and separable in...Show More
Metadata
Abstract:
IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.
Scope:
This standard covers electrical tests and performance requirements for exposed semiconducting shields on premolded cable accessories, specifically joints and separable insulated connectors, rated 5 kV through 35 kV.
Date of Publication: 29 November 1977
Electronic ISBN:978-0-7381-4388-0
ICS Code: 29.120.20 - Connecting devices
Persistent Link: https://ieeexplore.ieee.org/servlet/opac?punumber=2658
