CdTe semiconductor X-ray imaging sensor and energy subtraction method using X-ray energy information

A multichannel X-ray imaging sensor using a CdTe compound semiconductor radiation detector was developed. Both the digital X-ray imaging and energy-information-generating analyzing method were studied. The X-ray imaging sensor consisted of 512-channel CdTe detector elements at a pitch of 0.2 mm. X-ray photons were directly detected using a photon-counting method and high- and low-energy images were obtained simultaneously. The specific resolution was obtained over 2.5 line pairs/mm in the channel direction and 1.6 line pairs/mm in the scanning direction with a scanning pitch of 0.2 mm. The energy subtraction method was found to be effective in distinguishing an object's component materials.<>