Loading [a11y]/accessibility-menu.js
Dielectric measurements using the HP 85070A probe | IEEE Conference Publication | IEEE Xplore

Dielectric measurements using the HP 85070A probe


Abstract:

The authors describe the techniques for permittivity measurements using the Hewlett Packard HP 85070A Dielectric Probe Kit. The HP 85070A probe provides a flexible means ...Show More

Abstract:

The authors describe the techniques for permittivity measurements using the Hewlett Packard HP 85070A Dielectric Probe Kit. The HP 85070A probe provides a flexible means of dielectric measurements with only minimum sample preparation. Results from measurements of the dielectric constant of liquids and solids are presented for dielectric constants ranging from 2.5 to 80 and for lossless and lossy materials. The focus is on techniques for sample measurements and the accuracy, repeatability, and resolution obtained with this HP probe for performance characterization and evaluation.<>
Date of Conference: 12-15 April 1992
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-7803-0494-2
Conference Location: Birmingham, AL, USA

Contact IEEE to Subscribe

References

References is not available for this document.