Abstract:
The STM/FE images in a nanometer scale were successfully obtained by using an STM for the first time. The emission of electrons from grain boundaries of polycrystalline H...Show MoreMetadata
Abstract:
The STM/FE images in a nanometer scale were successfully obtained by using an STM for the first time. The emission of electrons from grain boundaries of polycrystalline HfC films also reported, where work function is larger than that on the grains.
Published in: 2005 International Vacuum Nanoelectronics Conference
Date of Conference: 10-14 July 2005
Date Added to IEEE Xplore: 26 June 2006
Print ISBN:0-7803-9384-8
ISSN Information:
No metrics found for this document.
Contents 