Abstract:
Continuous mode-hop free scanning from 1520 to 1570 nm using a compact, environmentally robust MEMS-tuned external cavity semiconductor laser at a rate of 0.4 Hz gives mo...Show MoreMetadata
Abstract:
Continuous mode-hop free scanning from 1520 to 1570 nm using a compact, environmentally robust MEMS-tuned external cavity semiconductor laser at a rate of 0.4 Hz gives monotonic scans with frequency jitter below 2 MHz
Published in: Conference on Lasers and Electro-Optics, 2004. (CLEO).
Date of Conference: 16-21 May 2004
Date Added to IEEE Xplore: 13 December 2004
Print ISBN:1-55752-777-6
Conference Location: San Francisco, CA, USA
Contents 