Near bottom sediment characterization offshore SW San Clemente Island | IEEE Conference Publication | IEEE Xplore

Near bottom sediment characterization offshore SW San Clemente Island


Abstract:

Normal incidence, 23.5 kHz seafloor acoustic backscatter data and bottom video were measured with the Deep Tow instrument package of the Scripps Institution of Oceanograp...Show More

Abstract:

Normal incidence, 23.5 kHz seafloor acoustic backscatter data and bottom video were measured with the Deep Tow instrument package of the Scripps Institution of Oceanography in 100 meter water depth south of San Clemente Island, CA. The collected data were processed using an echo envelope sediment characterization method, to derive geoacoustic parameters such as particle mean grain size and the strength of the power law characterizing the roughness energy density spectrum of the sediment-water interface. Two regions, sand and silt, were selected based on available ground truth, perceived along-track sediment homogeneity, data quality and tow fish stability. Distinction between sand and fine grain sediments can be accomplished by creation of feature vectors comprised of mean grain size (M/sub /spl Phi//) and interface roughness spectral strength (w/sub 2/). Estimates for mean grain size and roughness spectral strength (M/sub /spl Phi//, w/sub 2/) were (1.5, 0.0095) for sand, and (6.7, 0.0033) for silt, where M/sub /spl Phi// is expressed in PHI units, and w/sub 2/ has units cm/sup 4/. These results are consistent with local ground truth measurements and illustrate the potential of this sediment characterization method in survey mode.
Published in: OCEANS '02 MTS/IEEE
Date of Conference: 29-31 October 2002
Date Added to IEEE Xplore: 08 April 2003
Print ISBN:0-7803-7534-3
Conference Location: Biloxi, MI, USA

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