Abstract:
A technique for accurately measuring coupling capacitance is presented in this paper. The proposed on-chip test circuit can accurately and efficiently measure the line co...Show MoreMetadata
Abstract:
A technique for accurately measuring coupling capacitance is presented in this paper. The proposed on-chip test circuit can accurately and efficiently measure the line coupling capacitance and noise voltage. A simple on-chip analog-to-digital converter converts the measured analog signal into a digital signal. The I/O pads, bounding wires, package frame, external cables, and external test circuit do not affect the accuracy of the measurement. On-chip calibration is also included to further extend the test accuracy. Less than 1% error as compared to SPICE is achieved with this circuit. The circuit provides an effective and accurate technique for evaluating a variety of existing capacitance coupling models.
Published in: 15th Annual IEEE International ASIC/SOC Conference
Date of Conference: 25-28 September 2002
Date Added to IEEE Xplore: 06 January 2003
Print ISBN:0-7803-7494-0