Abstract:
The testability structure for digital circuits described in IEEE Std 1149.1™ has been extended to provide similar facilities for mixed-signal circuits. The architecture i...Show MoreScope:This standard defines a mixed-signal test bus architecture that provides the means of control and access to both analog and digital test signals such that the testability...Show More
Purpose:Where structures defined by this standard are incorporated into mixed-signal circuits, the testability problems posed by such circuits are mitigated by way of improving t...Show More
Metadata
Abstract:
The testability structure for digital circuits described in IEEE Std 1149.1™ has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to, both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration. Also, extensions to the standard Boundary-Scan Description Language (BSDL) are defined that allow description of key component-specific aspects of such testability features.
Scope:
This standard defines a mixed-signal test bus architecture that provides the means of control and access to both analog and digital test signals such that the testability structure for digital circuits described in IEEE Std 1149.16 has been extended effectively to provide similar facilities for mixed-signal circuits. In addition to testing interconnections in the conventional sense of IEEE Std 1149.1, the mixed-signal test bus defined by this standard also provides the means for parametric testing and, optionally, the means to access internal test structures. The standard does not mandate implementation details of the test circuitry, although examples of con...
Purpose:
Where structures defined by this standard are incorporated into mixed-signal circuits, the testability problems posed by such circuits are mitigated by way of improving the controllability and observability of mixed signal designs and supporting mixed-signal built-in test structures to reduce both test development time and testing costs and to improve test quality. In particular, these standardized test features allow mixed-signal (analog and/or digital) electronic components, printed circuit assemblies, and electronic systems to be accessible to external or built-in test equipment for interconnect test, parametric test, and internal test. A further purpose ...
Date of Publication: 06 December 2024
Electronic ISBN:979-8-8557-1465-4
ICS Code: 31.180 - Printed circuits and boards
Persistent Link: https://ieeexplore.ieee.org/servlet/opac?punumber=10774203
