DeIL: Direct-and-Inverse CLIP for Open-World Few-Shot Learning | IEEE Conference Publication | IEEE Xplore

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DeIL: Direct-and-Inverse CLIP for Open-World Few-Shot Learning


Abstract:

Open-World Few-Shot Learning (OFSL) is a critical field of research, concentrating on the precise identification of target samples in environments with scarce data and un...Show More

Abstract:

Open-World Few-Shot Learning (OFSL) is a critical field of research, concentrating on the precise identification of target samples in environments with scarce data and unre-liable labels, thus possessing substantial practical signif-icance. Recently, the evolution of foundation models like CLIP has revealed their strong capacity for representation, even in settings with restricted resources and data. This development has led to a significant shift in focus, tran-sitioning from the traditional method of “building models from scratch” to a strategy centered on “efficiently utilizing the capabilities of foundation models to extract rele-vant prior knowledge tailored for OFSL and apply it judi-ciously”. Amidst this backdrop, we unveil the Direct-and-Inverse CLIP (DeIL), an innovative method leveraging our proposed “Direct-and-Inverse” concept to activate CLIP-based methods for addressing OFSL. This concept transforms conventional single-step classification into a nuanced two-stage process: initially filtering out less probable cate-gories, followed by accurately determining the specific cat-egory of samples. DeIL comprises two key components: a pretrainer (frozen) for data denoising, and an adapter (tun-able) for achieving precise final classification. In experiments, DeIL achieves SOTA performance on 11 datasets. https://github.com/The-Shuai/DeIL.
Date of Conference: 16-22 June 2024
Date Added to IEEE Xplore: 16 September 2024
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Conference Location: Seattle, WA, USA

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