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Deep forests with tree-embeddings and label imputation for weak-label learning | IEEE Conference Publication | IEEE Xplore

Deep forests with tree-embeddings and label imputation for weak-label learning


Abstract:

Due to recent technological advances, a massive amount of data is generated on a daily basis. Unfortunately, this is not always beneficial as such data may present weak-s...Show More

Abstract:

Due to recent technological advances, a massive amount of data is generated on a daily basis. Unfortunately, this is not always beneficial as such data may present weak-supervision, meaning that the output space can be incomplete, inexact, and inaccurate. This kind of problems is investigated in weakly-supervised learning. In this work, we explore weak-label learning, a structured output prediction task for weakly-supervised problems where positive annotations are reliable, whereas negatives are missing. For the first time in this class of problems, we investigate deep forest algorithms based on tree-embeddings, a recently proposed feature representation strategy leveraging the structure of decision trees. Furthermore, we propose two new procedures for label-imputation in each layer, named Strict Label Complement (SLC), which provides fixed conservative estimates for the number of missing labels and employs them to restrict imputations, and Fluid Label Addition (FLA), which performs such estimations on every layer and uses them to adjust the imputer’s predicted probabilities without any restrictions. We combine the new approaches with deep forest architectures to produce four new algorithms: SLCForest and FLAForest, using output space feature augmentation, and also the cascade forest embedders CaFE-SLC and CaFE-FLA, employing both tree-embeddings and the output space. Our results reveal that our methods provide superior or competitive performance to the state-of-the-art. Furthermore, we also noticed that our methods are associated with better results even in cases without weak-supervision.
Date of Conference: 30 June 2024 - 05 July 2024
Date Added to IEEE Xplore: 09 September 2024
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Conference Location: Yokohama, Japan

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