Feature selection using a mutual information based measure | IEEE Conference Publication | IEEE Xplore

Feature selection using a mutual information based measure


Abstract:

In this paper, we discuss the problem of feature selection for the purpose of classification and propose a solution based on the concept of mutual information. In additio...Show More

Abstract:

In this paper, we discuss the problem of feature selection for the purpose of classification and propose a solution based on the concept of mutual information. In addition, we propose a new evaluation function to measure the ability of feature subsets in distinguishing between class labels. The proposed function is based on the information gain taking into consideration how features work. Finally, we discuss the performance of this function compared to that of other measures which evaluate features individually.
Date of Conference: 11-15 August 2002
Date Added to IEEE Xplore: 09 July 2003
Print ISBN:0-7695-1695-X
Print ISSN: 1051-4651
Conference Location: Quebec City, QC, Canada

Contact IEEE to Subscribe

References

References is not available for this document.