Introduction
Electric power devices dealing with high DC voltages, high electric fields, and complex environments have increased in recent years. Therefore, the need to enhance the reliability and durability of electric power equipment has become imperative. Consequently, the demand for research on the diagnosis of electrical insulators has also increased.
Q(t) measurement is a diagnostic technique used for electrical insulators in power devices, cables, and other equipment [1], [2], [3], [4], [5], [6], [7], [8], [9], [10], [11], [12], [13], [14]. Q(t) measurement was first demonstrated in the 1970s by Takada et al. [1]. The circuit mechanism and structure are similar to those of a leakage current detector, which can detect extremely small electric currents that indicate the incompleteness and/or the defects of electrical insulation inside insulators. In contrast to partial discharge (PD) diagnosis [15], [16], which is primarily used for oscillating voltage, Q(t) measurement is applicable to DC voltage applications.
Several studies have been reported on Q(t) measurement. Hanazawa et al. demonstrated the relationship between the temperature and leakage current around a power device [4], [5]. Wang et al. applied Q(t) measurement to detect water treeing [6]. Wang et al. [7], Fujii et al. [8], [9], and Iwata et al. [10] demonstrated that leakage current increases with electrical treeing. Kadowaki et al. [14] performed simultaneous measurements to obtain synced data of Q(t) measurement and used the pulsed electro-acoustic (PEA) method and an equivalent circuit model of a cross-linked polyethylene (XLPE) cable to express PEA data.
Our previous research [11] indicated the importance of a detailed analysis of Q(t) measurement data, particularly in high-temperature environments. However, these data exhibit temperature dependency, making the analysis challenging.
Previous research assumed the circuit model shown in Fig. 1(a). This is because previous studies primarily focused on verifying the difference between samples and/or the pretreatment conditions. The circuit model is effective for Q(t) measurement data containing linear parts (against time) and constant charging speed. However, a mathematical model is required to analyze Q(t) measurement data in high-temperature environments and compare them with other experiment and simulation results, such as PEA data. Moreover, mathematical and physical models for distinguishing the transition from absorption to leakage current based on experimental results have not been developed, despite this being one of the advantages of using Q(t) measurement over other leakage current detection methods. This presents substantial risks in actual diagnoses owing to the lack of proper understanding and treatment of experimentally obtained Q(t) measurement values.
(a) Circuit model from a previous study, (b) typical experimental results, (c) difference between an experiment result at room temperature and the circuit model of (b), and (d) difference between the results at 50 °C and 80 °C.
Therefore, this study focuses on the parameter fitting of the delay characteristics of Q(t) measurement. Fig. 1(b) illustrates a typical result pattern of Q(t) measurements at room temperature (less than 35 °C). A previous study [10] used the Q(t) circuit model shown in Fig. 1(a) to analyze such data; however, this model does not represent the delay properties. Fig. 1(c) shows a schematic representation of a comparison between typical experimental Q(t) measurement data at room temperature and the reconstructed data from the solution of the circuit model shown in Fig. 1 (a) (note that the position of the start time (t = 0) of the two plots shown in Fig. 1(c) are slightly shifted intentionally to visually distinguish the steep rising process of each plot). In addition, Fig. 1(d) compares typical experimental data of Q(t) measurements at 50 and 80 °C. Fig. 1(c) and (d) show that after the initial charging at t = 0 s, the results for low-temperature conditions rapidly transitioned to a linear phase; by contrast, the results for high-temperature conditions had an extremely long transition time. This indicates that Q(t) data obtained under high-temperature conditions require a more complicated fitting model compared with those under low-temperature conditions.
This study proposes a novel circuit model. First, a differential equation is formulated and solved based on a circuit model of Q(t) measurements to obtain the delay parameters of a parallel connection of one capacitor, one resistor, and one capacitor–resistor series combination. Second, an estimation method for the circuit property parameters is introduced based on approximations of the solutions. The mathematical analysis reveals a relationship between the charges within the Q(t) meter and those estimated inside the insulation material, a concept similar to space charges. In addition, numerical testing is performed to assess the appropriateness and basic features of the proposed method. Third, a regression analysis on the experimental data obtained from Q(t) measurements of polyimide (PI) sheet samples at 80 °C is performed. The performance of the proposed estimation method is evaluated by calculating the root mean square error (RSME). Finally, the relationship between the physical meaning and a material model of Q(t) measurement and the limitations of the estimation method are determined.
Methods
The methodology is summarized as follows: First, a circuit model is described. Second, the differential equation of the model is solved. Third, parameters are estimated using the proposed procedure. Fourth, numerical tests are performed to verify the estimation method. Finally, experimental Q(t) data of PI sheet samples at 80 °C (PI 80 °C data) are fitted, and the material properties (expressed as circuit properties) are estimated.
A. Circuit Model and Ordinary Differential Equation of a Model With One Capacitor, One Resistor, and a Series-Connected Capacitor–Resistor
Fig. 2 shows the novel circuit model of the Q(t) measurement comprising one capacitor, one resistor, and one series capacitor–resistor combination (3-parallel model). \begin{align*}& V_{0} - I_{2}R_{2} - \frac {Q_{2}\left ({t }\right)}{C_{2}} - \frac {Q_{0}\left ({t }\right)}{C_{0}} - I_{0}R_{0}= 0, \tag{1}\\[-0.5em]{}\smash {\left \{{\vphantom {\begin{matrix}.\\.\\.\\.\\.\\.\\.\\.\\.\\.\\.\\ \end{matrix}}}\right.}& \\[-0.5em]& I_{1}R_{1} - \frac {Q_{3}\left ({t }\right)}{C_{3}}\mathrm {= 0,} \tag{2}\\& I_{2}R_{2} +\frac {Q_{2}\left ({t }\right)}{C_{2}}=I_{1}R_{1}, \tag{3}\\& I_{1} + I_{2}{+ I}_{3} = I_{0},\tag{4}\end{align*}
Circuit model containing the main resistance
A 3-parallel model is assumed to behave like an insulator with voids, and it also contains charge-delaying parameters that serve as “a damper in an oscillating system” for electrical charges. Though limitations exist in separating the parameters (e.g., insulators, the gap between electrodes, and the effect of surface roughness cannot be separated), the model was selected primarily owing to its outlook and simplicity in the mathematical analysis. Section III-C presents a detailed discussion of the model.
In a normal case, \begin{equation*} A\frac {\mathrm {d}^{3}Q_{2}(t)}{\mathrm {d}t^{3}} + B\frac {\mathrm {d}^{2}Q_{2}(t)}{\mathrm {d}t^{2}} + C\frac {{\mathrm {d}Q}_{2}\left ({t }\right)}{\mathrm {d}t} + DQ_{2}\left ({t }\right) \mathrm {= 0,} \tag{5}\end{equation*}
\begin{align*} A&=C_{0}C_{3}R_{0}R_{2}, \\ B& = \frac {C_{0}R_{0}R_{2} + C_{0}R_{0}R_{1}}{R_{1}} + \frac {C_{0}C_{3}R_{0} + C_{0}C_{2}R_{2}}{C_{2}} + C_{3}R_{2}, \\ C& = \frac {(C_{0}R_{1} + C_{0}R_{0} + C_{2}R_{2} + C_{2}R_{1}+ C_{3}R_{1})}{C_{2}R_{1}}, \\ D& = \frac {1}{{C_{2}R}_{1}}\mathrm {.}\end{align*}
\begin{align*} \alpha &= -\frac {B}{3A} -\sqrt [{3}]{\frac {3\sqrt {3} q +\sqrt {27q^{2}\mathrm {+ 4}p^{3}} }{6\sqrt {3}}}\omega \\ &\quad -\sqrt [{3}]{\frac {3\sqrt {3} q -\sqrt {27q^{2}\mathrm {+ 4}p^{3}} }{6\sqrt {3}}}\mathrm {\omega }^{2}, \tag{6}\\ \beta &= -\frac {B}{3A}-\sqrt [{3}]{\frac {3\sqrt {3} q+\sqrt {27q^{2}+4p^{3}}}{6\sqrt {3}}}\omega ^{2} \\ &\quad -\sqrt [{3}]{\frac {3\sqrt {3} q -\sqrt {27q^{2}+4p^{3}}}{6\sqrt {3}}}{\omega,} \tag{7}\\ \gamma &= -\frac {B}{3A}-\sqrt [{3}]{\frac {3\sqrt {3} q+\sqrt {27q^{2}\mathrm {+ 4}p^{3}} }{6\sqrt {3}}} \\ &\quad -\sqrt [{3}]{\frac {3\sqrt {3} q-\sqrt {27q^{2}+ 4p^{3}} }{6\sqrt {3} },} \tag{8}\end{align*}
\begin{align*} p&=\frac {-B^{2}+ 3AC}{3A^{2}} \\ q&=\frac {2B^{3} - 9ABC + 27A^{2}D}{27A^{3}},\end{align*}
Subsequently, using the above solutions, the solution of the \begin{equation*} \therefore Q_{2}\left ({t }\right)=H_{1}\exp {\left ({\alpha t }\right)}+H_{2}\exp {\left ({\beta t }\right){+ H}_{3}\exp \left ({\gamma t }\right)\mathrm {.}} \tag{9}\end{equation*}
\begin{align*} Q_{3}\left ({t }\right)& = \frac {C_{3}}{C_{2}}{\{\left ({C_{2}R_{2}\alpha + 1 }\right)H}_{1}\exp \left ({\alpha t }\right) \\ &\quad +(C_{2}R_{2}\beta + 1)H_{2}\exp {(\beta t)} \\ &\quad +(C_{2}R_{2}\gamma + 1)H_{3}\exp {(\gamma t)}\}, \tag{10}\\ Q_{0}\left ({t }\right) & = \left ({-{M}_{1}\alpha ^{2} -{M}_{2}\alpha - M_{3} }\right)H_{1}\exp \left ({\alpha t }\right) \\ &\quad +{(- M_{1}\beta ^{2} - M_{2}\beta - M_{3})H}_{2} \mathrm {exp}(\beta t) \\ &\quad + {(- M_{1}\gamma ^{2} - M_{2}\gamma - M_{3})H}_{3}\exp {(\gamma t)} \\ &\quad + C_{0}V_{0}, \tag{11}\end{align*}
\begin{align*} {M}_{1}&={C_{0}C}_{3}R_{0}R_{2}, \tag{12}\\ M_{2}&=\frac {(C_{2}R_{1} + C_{2}R_{2} + C_{3}R_{1})C_{0}R_{0}}{C_{2}R_{1}}+{C}_{0}R_{2}, \tag{13}\\ {M}_{3}&=\frac {C_{0}R_{0}+C_{0}R_{1}}{C_{2}R_{1}}\mathrm {.} \tag{14}\end{align*}
The boundary conditions are \begin{align*} H_{1}&=\frac {C_{0}V_{0} \left ({\gamma -\beta }\right)}{N_{0}}, \tag{15}\\ H_{2}&=\frac {C_{0}V_{0}\left ({\alpha - \gamma }\right)}{N_{0}}, \tag{16}\\ H_{3}&=\frac {C_{0}V_{0}\left ({\beta -\alpha }\right)}{N_{0}}, \tag{17}\end{align*}
\begin{equation*} N_{0}=M_{1}{\{\alpha }^{2}\left ({\gamma - \beta }\right) + \beta ^{2}\left ({\alpha - \gamma }\right) + \gamma ^{2}\left ({\beta - \alpha }\right).\end{equation*}
B. Approximation of the Solution of the 3-Parallel Model Parameters
Approximations are necessary to estimate the parameters of circuit properties from the solution(s) of the 3-parallel model. The approximations require some hypotheses. Note that for ease of explanation, a clear outlook is prioritized over mathematical rigidity in the subsequent sections.
Insulators typically exhibit extremely high resistances and low capacitances. By contrast, \begin{align*} \beta &\cong - \frac {1}{C_{2}R_{2}}, \tag{18}\\ \gamma & \cong - \frac {1}{C_{3}R_{0}}, \tag{19}\\ H_{1}&\cong C_{2}V_{0}, \tag{20}\\ H_{2} &\cong {- C}_{2}V_{0}, \tag{21}\\ H_{3}&\cong \frac {C_{3}R_{0}V_{0}}{R_{2}}\mathrm {.} \tag{22}\end{align*}
Representative image of the approximated values in the steep-change and linear stages.
Details of the approximation process in this section are discussed in the preceding section of Appendix A.
C. Estimation of the 3-Parallel Model Parameters
Hereinafter, the
The estimation process is summarized as follows: Before the first step, \begin{equation*} Q_{2}\left ({t }\right)\cong H_{1} +H_{2}\exp \left ({\beta t }\right)\mathrm {\cong -}H_{2}+H_{2} \exp \left ({\beta t }\right) \tag{23}\end{equation*}
D. Numerical Testing
This section presents the numerical tests performed to evaluate the appropriateness of the estimation method presented in Section II-C. A “restoration test” was employed, which involved using imaginary data yielded by the predetermined values of the circuit constant. Two test conditions were considered referring to [10], as shown in Table 1. The timestep of creating the imaginary data was set to 1 s. This test assessed the difference between the original values of
E. Regression of Experimental Results With the 3-Parallel Model
A regression analysis on the experimental data obtained through the Q(t) measurement of PI was performed to apply the proposed method to an actual case. This regression estimates the actual cause of the delay parameters of an insulation material and specifies the detailed charging saturation time under the 3-parallel model. Owing to the hyperparameter used to decide the fitting range in the regression, the difference between the estimated and original
Experimental setup of Q(t) measurements of PI: (a) outline of the actual setup and (b) circuit outline.
When t = 0, the DC voltage switch turned on and the set value was 1 kV. Charges started to accumulate at the Q(t) meter and the sample. Note that experimental data used in the regression are slightly modified because original experimental data contain data-missing and/or biases of zero position.
Results and Discussions
A. Results of Numerical Testing on the 3-Parallel Model
Fig. 5(a) and (b) show the Q(t) data of
Tables III(a) and (b) list the estimated parameters from the numerical testing results of condition sets (i) and (ii), respectively. The fitting time range must be set as a hyperparameter; the fitting start time was set to 0 s, and the fitting end number row in Table 3 indicates the fitting end time. To optimize the fitting end time, values from 20 s to 140 s (in 10 s increments) were searched in test condition set (i) and from 150 s to 300 s (in 10 s increments) in test condition set (ii); the fitting end times selected based on the RMSE were 30 and 240 s, respectively. Table 3 also shows the ratio of the estimated circuit properties per the true. Fig. 6(a) and (b) show the plots of the estimated Q(t) data obtained by substituting all estimated circuit properties and the true
Reconstructed
Based on Table 3, the estimated circuit properties obtained from test condition set (ii) were consistent with the true values. By contrast, the estimated values obtained from test condition set (i) did not correspond with the true values. This was primarily because the time resolution of the steep-change stage was insufficient in test condition set (i); the time step was set to 1 s, but the first timestep (at approximately 0 s to 1 s) already encompassed the delay stage. A comparison between the estimated and true values of
Illustrated risks of insufficient time resolution. (a) insufficient time step = 1 s and (b) sufficient time step = 0.1 s.
B. Regression of Experimental Results
Fig. 8(a) shows the Q(t) measurement data of seven PI sheet samples at 80 °C. Fig. 8(b) shows an example of a polyimide sheet data at 50 °C for comparison purposed. In general, the graphs at 80 °C have much larger delay curves in the delay stage than those at 50 °C. Table 4 shows the estimated circuit properties obtained from regression of the experimental data. Similar to the numerical testing, the best fitting end time was selected based on the RSME. To optimize the fitting end time, values from 200 s to 2900 s (in 100 s increments) were searched for each sample.
Fig. 9 shows the plots of the estimated Q(t) data (
C. Practical and Physical Meaning of the Obtained Results and Calculated Parameters
Fig. 10(a)–(c) show a series of explanations of how this study related the material and electromagnetic model to the circuit model. Fig. 10(a) shows an image of an insulator with its internal charges under high-voltage conditions while obtaining Q(t) measurement data (the duration from the steep-change stage to the delay stage was considered). Subsequently, the charges between electrodes were assumed to move and be within the insulators. In the middle of Fig. 10(a), the distance between the leading edges of the positive and negative charges was assumed to be a time-dependent value, influencing the values of the R and C of the circuit as the charges move. Notably, in this model, this distance does not affect the basic structure of the circuit model of the material. In the bottom of Fig. 10(a), considering the material volume between the leading edges of the positive and negative charges, the structure of the material must be related to circuit properties.
Explanation of the correlation between the material/electromagnetic model and circuit model: (a) image of an insulator with its intrinsic charges under high-voltage conditions and during Q(t) measurement, (b) circuit model considered from the analogy of estimating material properties of composite material, and (c) simplification of the circuit model resulting in the 3-parallel model.
As an example, a material model of an insulator or dielectric containing voids, defects, and/or impurities, was considered, such that the material is not a perfect (ideal) insulator. The volume can be considered as the composite of various parts of a conductor and perfect insulator. The structure of the insulator was approximated as a circuit model, as shown in Fig. 10(b). The approximation process is based on Fig. 10(a), the analogy of the homogenization method typically used for estimating macroscopic material properties (such as modulus) of composite materials [17], [18], and the basic circuit theory regarding the combination of multiple resistors or capacitors.
Disregarding the serial connection(s) of the models (for simplicity), the structure was simplified into a circuit element comprising a parallel combination of a capacitor, resistor, and series-connected capacitor and resistor. Accordingly, the proposed 3-parallel model is considered as one of the simplest models representing such structure, as shown in Fig. 10(c).
Considering the definitions of
Based on the above discussion, it can be inferred that
Though the
D. Limitation of This Research and Problems Encountered
As previously mentioned in Section III-A, when the target Q(t) data exhibit rapid changes in the steep-change stage that cannot be captured owing to the limited time resolution, the estimated circuit properties tend to deviate from the true values. The experimental limitation of the timestep should be improved to prevent this phenomenon. The experimental setup in this study had a 1 s timestep limitation. Under this constraint, the proposed method may not be applicable to samples at low temperatures. Otherwise, the calculations may yield values approximately twice or half of the true
From an optimization and fitting perspective, the best fitting end time obtained based on the RMSE may not necessarily yield the best circuit properties. For example, as shown in Table 3, the fitting end time that yielded the lowest RMSE was 30 s; however, the closest estimates to the true values of
Two key limitations were identified in the modeling phase. First, the 3-parallel model can only accommodate simple time dependency of the R and C components of an insulator, and
Therefore, extensive research on the theoretical and experimental methods is necessary to improve Q(t) measurements.
Conclusion
The 3-parallel circuit model is significant for parameter fitting to analyze Q(t) data obtained under high-temperature conditions and achieve a deeper understanding of the physical meaning of the obtained data. In this research, a parallel circuit model comprising a capacitor, resistor, and series-connected capacitor and resistor was first developed as a representative insulator model under high-temperature conditions. Upon solving the
Solving the differential equations determined the parameters that define the charging behavior in the steep-change, delay, and linear stages. These stages corresponded to the rapid increase in charges in the initial stage of Q(t) measurement, delay after initial charging, and nearly linear increments in the latter part of the measurement, respectively.
The numerical test results indicated that when the time resolution is sufficiently high (e.g., under a high-temperature condition), such that the borders of the steep-change and delay stages can be distinguished, the proposed estimation method could successfully obtain circuit properties data.
The regression of the experimental data revealed that the actual experimental data were consistent with the estimated values of the circuit properties and the 3-parallel model. Thus, the proposed estimation method can be used as a simple approximation method for analyzing charges within an insulator.
Based on the identified modeling and numerical analysis limitations, the following are suggested for future works:
When applying the proposed method for in-depth analysis of space charges in both time and spatial domains, the estimation method should incorporate more complex techniques, such as the combination of the PEA results and/or introduction of directly time-dependent resistor and/or capacitor components in the circuit model.
This research demonstrated the effects of applying a circuit model to a fundamental analysis of insulators. To address the effects that can be expressed only by quantum mechanics, the results obtained using the quantum mechanics/molecular dynamics (QM/MD) method should be considered.
ACKNOWLEDGMENT
The authors would like to thank Tatsuo Takada, who is an emeritus professor with Tokyo City University, Hiroaki Uehara, who is a professor with Kanto Gakuin University, Tatsuki Okamoto, who is a visiting research scholar with Kanto Gakuin University, and Hiroshi Deguchi, who is a technical staff with the Osaka Research Institute of Industrial Science and Technology.
Appendix AApproximation of Parameters
Approximation of Parameters
Approximation of Parameters Used in Q2 (t)
A series of approximations was performed to express
When \begin{align*} \gamma &\cong -\frac {B}{3A}- 2\sqrt [{3}]{\frac {q}{2}} \\ & = -\frac {B}{3A}\mathrm {- 2}\left \{{ \frac {B^{3}}{27A^{3}}\left ({\mathrm {1 +}\frac {27A^{3}}{B^{3}}\mathrm {\cdot }\frac {\mathrm {(3}AD -BC)}{6A^{2}} }\right) }\right \}^{\frac {1}{3}} \\ & \cong - \frac {B}{A}\cong -\frac {C_{0}R_{2}}{C_{0}C_{3}R_{0}R_{2}}= -\frac {1}{C_{3}R_{0}}. \tag{24}\end{align*}
\begin{align*} H_{3}&= \frac {C_{0}V_{0}\left ({\beta -\alpha }\right)}{N_{0}} \cong \frac {C_{0}V_{0}}{M_{1}\gamma ^{2}} = \frac {V_{0}}{{C_{3}R}_{0}R_{2}\gamma ^{2}}\cong \frac {{C_{3}V}_{0}R_{0}}{R_{2}}. \\{}\tag{25}\end{align*}
Imaginary values based on \begin{align*} \beta \cong \alpha +\beta &= -\frac {2B}{3A} -\sqrt [{3}]{\frac {3\sqrt {3} q +\sqrt {27q^{2}+ 4p^{3}} }{6\sqrt {3}}}\left ({\omega ^{2}+ \omega }\right) \\ &\quad -\sqrt [{3}]{\frac {3\sqrt {3} q-\sqrt {27q^{2}+ 4p^{3}} }{6\sqrt {3}}}\left ({\mathrm {\omega }^{2}+ \omega }\right) \\ \therefore \beta &\cong -\frac {2B}{3A}+\sqrt [{3}]{\frac {3\sqrt {3} q+\sqrt {27q^{2}+ 4p^{3}} }{6\sqrt {3}}} \\ &\quad +\sqrt [{3}]{\frac {3\sqrt {3} q-\sqrt {27q^{2}+ 4p^{3}} }{6\sqrt {3}}} \\ &\quad \left ({\because \left ({\omega ^{2}+ \omega + 1 = 0 }\right) }\right) \tag{26}\end{align*}
\begin{align*} \beta &\cong -\frac {2B}{3A}+ 2\sqrt [{3}]{\frac {q}{2}} \\ &\quad = -\frac {2B}{3A}+ 2\left \{{ \frac {B^{3}}{27A^{3}}\left ({\mathrm {1 +}\frac {27A^{3}}{B^{3}}\mathrm {\cdot }\frac {\mathrm {(3}AD -BC)}{6A^{2}} }\right) }\right \}^{\frac {1}{3}} \\ &\cong -\frac {2B}{3A}+\frac {2B}{3A}\left \{{ \mathrm {1 +}\frac {1}{3}\mathrm {\cdot }\frac {27A^{3}}{B^{3}}\mathrm {\cdot }\frac {\left ({3AD-BC }\right)}{6A^{2}} }\right \} \\ &\cong -\frac {2B}{3A}\mathrm {\cdot }\frac {1}{3}\mathrm {\cdot }\frac {27A^{3}}{B^{3}}\mathrm {\cdot }\frac {BC}{6A^{2}}= -\frac {C}{B}\cong \frac {1}{{C_{2}R}_{2}} \tag{27}\end{align*}
\begin{align*} H_{1}&=\frac {C_{0}V_{0}\left ({\gamma -\beta }\right)}{N_{0}}\cong \frac {C_{0}V_{0}}{M_{1}\gamma \beta }=\frac {V_{0}}{{C_{3}R}_{0}R_{2}\gamma \beta }\cong C_{2}V_{0} \\ &\quad \left ({= {\mathrm {- H}}_{2} }\right)\mathrm {.} \tag{28}\end{align*}
Approximation of Basic Behavior of Q0 (T)
Considering the approximation of \begin{align*} Q_{0}\left ({t }\right)\cong \left ({- M_{1}\alpha ^{2} -{M}_{2}\alpha -{M}_{3} }\right)H_{1}\exp \left ({\alpha t }\right)+C_{0}V_{0}, \\{}\tag{29}\end{align*}
\begin{equation*} \frac {\mathrm {d}Q_{0}\left ({t }\right)}{\mathrm {d}t}\cong \left ({-M_{1}\alpha ^{3} -M_{2}\alpha ^{2} -M_{3}\alpha }\right)H_{1}\exp \left ({\alpha t }\right). \tag{30}\end{equation*}
\begin{align*} &\hspace {-1pc} \left ({-M_{1}\alpha ^{3} -M_{2}\alpha ^{2} -M_{3}\alpha }\right)H_{1}\exp \left ({\alpha t }\right) \\ & \cong -A\frac {\mathrm {d}^{3}Q_{2}\left ({t }\right)}{\mathrm {d}t^{3}} -B\frac {\mathrm {d}^{2}Q_{2}\left ({t }\right)}{\mathrm {d}t^{2}} -C\frac {\mathrm {d}Q_{2}\left ({t }\right)}{\mathrm {d}t^{}} \\ & =DQ_{2}\left ({t }\right)=\frac {H_{1}\exp \left ({\alpha t }\right)}{{C_{2}R}_{1}}\mathrm {.} \tag{31}\end{align*}
\begin{equation*} \frac {H_{1}\exp \left ({\alpha t }\right)}{{C_{2}R}_{1}}\cong \frac {H_{1}}{{C_{2}R}_{1}}\left ({1 +\alpha t }\right)\cong \frac {H_{1}}{{C_{2}R}_{1}}=\frac {V_{0}}{R_{1}}\mathrm {.} \tag{32}\end{equation*}
The rapid increase in \begin{equation*} -\left ({-M_{1}\gamma ^{2} -M_{2}\gamma -M_{3} }\right)H_{3}\cong \frac {C_{0}R_{2}}{R_{0}C_{3}}H_{3}=C_{3}V_{0}\mathrm {.} \tag{33}\end{equation*}
\begin{equation*} -\frac {C_{3}}{C_{2}}\left ({C_{2}R_{2}\gamma + 1 }\right)H_{3}\cong -{C_{3}R}_{2}\gamma H_{3}=C_{3}V_{0}. \tag{34}\end{equation*}