Abstract:
In this work we propose a method to generate true random numbers which exploits the large variation of the transient behaviour of the memristor’s resistive state, when pr...Show MoreMetadata
Abstract:
In this work we propose a method to generate true random numbers which exploits the large variation of the transient behaviour of the memristor’s resistive state, when programmed by very short pulses. Analog signal processing techniques are used to overcome drift-related limitations to the spectral purity and the run length of memristive random number generators. The resulting random bit sequences pass NIST randomness tests.
Date of Conference: 04-07 December 2023
Date Added to IEEE Xplore: 10 January 2024
ISBN Information: