Insertion loss reduction by optimization of waveguide perturbations | IEEE Conference Publication | IEEE Xplore
Scheduled Maintenance: On Monday, 30 June, IEEE Xplore will undergo scheduled maintenance from 1:00-2:00 PM ET (1800-1900 UTC).
On Tuesday, 1 July, IEEE Xplore will undergo scheduled maintenance from 1:00-5:00 PM ET (1800-2200 UTC).
During these times, there may be intermittent impact on performance. We apologize for any inconvenience.

Insertion loss reduction by optimization of waveguide perturbations


Abstract:

We describe a method to significantly decrease insertion loss in waveguide-based devices, including optical cross-connects. Reductions as large as 3 dB are obtained in 32...Show More

Abstract:

We describe a method to significantly decrease insertion loss in waveguide-based devices, including optical cross-connects. Reductions as large as 3 dB are obtained in 32/spl times/32 switches by optimizing the dielectric perturbations.
Date of Conference: 17-22 March 2002
Date Added to IEEE Xplore: 07 May 2003
Print ISBN:1-55752-701-6
Conference Location: Anaheim, CA, USA

Contact IEEE to Subscribe

References

References is not available for this document.