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A High-Speed and Low-Noise Charge Pump for PLL | IEEE Conference Publication | IEEE Xplore

A High-Speed and Low-Noise Charge Pump for PLL


Abstract:

This paper introduces a high-speed and low-noise charge pump for phase-locked loop. The use of low-voltage switch increases the turn-on and turn-off speed and charge pump...Show More

Abstract:

This paper introduces a high-speed and low-noise charge pump for phase-locked loop. The use of low-voltage switch increases the turn-on and turn-off speed and charge pump can operate at 300 MHz. The output current range of the charge pump is 2-30mA in 2mA steps and the current mismatch less than 0.5%. The phase noise is -223.2 dBA/Hz@1MHz at 2 mA and -206.6 dBA/Hz@10KHz at 30 mA.
Date of Conference: 27-30 October 2023
Date Added to IEEE Xplore: 29 December 2023
ISBN Information:
Conference Location: Huzhou, China

I. Introduction

The charge pump is one of the core modules of the phase-locked loop. It converts the voltage pulse signal with phase difference information output from the PFD into a current that charges and discharges the loop filter to change the control voltage of the VCO. Charge pump suffers from non-ideal effects such as charge injection, clock feedthrough, and current mismatch [1]. These effects will degrade the PLL reference spur and phase noise [2]. Typical charge pumps are drain-switched charge pump, source-switched charge pump and gate-switched charge pump, as shown in Fig. 1. The drain-switched charge pump has a fast turn-on response, but suffers from charge sharing, charge injection, and clock feedthrough. The source-switched charge pump has a small current mismatch and weak charge injection effect, but affected by clock feedthrough. Gate-switched charge pump reduces charge injection, charge sharing, and clock feedthrough, but has current mismatch problem.

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References

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