Abstract:
Accurate measurement of soft and hard switching losses is challenging. Electrical methods are prone to errors and calorimetric measurements most often cannot separate tur...Show MoreMetadata
Abstract:
Accurate measurement of soft and hard switching losses is challenging. Electrical methods are prone to errors and calorimetric measurements most often cannot separate turn-on and turn-off energies. We present a calorimetric test setup capable of measuring and separating turn-on and turn-off energies in soft and hard switching regimes. The resulting loss map can be used to accurately predict power semiconductor losses, even when the converter is not fully in the soft-switching regime.
Date of Conference: 29 October 2023 - 02 November 2023
Date Added to IEEE Xplore: 29 December 2023
ISBN Information: