Classification of Uncertainty Sources for Reliable Bayesian Estimation | IEEE Conference Publication | IEEE Xplore
Scheduled Maintenance: On Monday, 30 June, IEEE Xplore will undergo scheduled maintenance from 1:00-2:00 PM ET (1800-1900 UTC).
On Tuesday, 1 July, IEEE Xplore will undergo scheduled maintenance from 1:00-5:00 PM ET (1800-2200 UTC).
During these times, there may be intermittent impact on performance. We apologize for any inconvenience.

Classification of Uncertainty Sources for Reliable Bayesian Estimation


Abstract:

Recursive Bayesian estimation has emerged as a key tool for estimating the unknown state of a system. The wide range of applications has resulted in a correspondingly wid...Show More

Abstract:

Recursive Bayesian estimation has emerged as a key tool for estimating the unknown state of a system. The wide range of applications has resulted in a correspondingly wide variety of estimation algorithms. The Kalman filter and its derivatives, like extended and unscented Kalman filters, are the most prominent examples, while non-Gaussian full-blown filters are on the rise with the increasing availability of computational power. The filtering results are naturally accompanied by an assessment of the estimate’s uncertainty. However, this assessment may mislead the user into believing that the estimate is reliable, i.e., that the uncertainty reported by the filter matches the actual uncertainty. For a filter to assess its uncertainty correctly, often strict requirements must be met. The misalignment can be attributed to different origins, for which this work proposes a classification covering different stages of a filter design. Approximations and assumptions made in each class impair the filter’s reliability. This paper provides a conceptual perspective on how reliability can be defined and how it can be assessed. An example of a reliability index is examined in a simulated scenario to illustrate how it can contribute to a better understanding of the overall performance of a filter.
Date of Conference: 27-29 November 2023
Date Added to IEEE Xplore: 21 December 2023
ISBN Information:

ISSN Information:

Conference Location: Bonn, Germany

Contact IEEE to Subscribe

References

References is not available for this document.