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Multilevel testability analysis and solutions for integrated Bluetooth transceivers | IEEE Journals & Magazine | IEEE Xplore

Multilevel testability analysis and solutions for integrated Bluetooth transceivers


Abstract:

As use of wireless communications rises and profit margins shrink, low-cost solutions are becoming increasingly important. Incorporating test design and DFT into the syst...Show More

Abstract:

As use of wireless communications rises and profit margins shrink, low-cost solutions are becoming increasingly important. Incorporating test design and DFT into the system design flow is essential to achieving such solutions. This case study analyzes test requirements, implications, and test cost for low-cost Bluetooth systems, which enable communication among several electronic components.
Published in: IEEE Design & Test of Computers ( Volume: 19, Issue: 5, Sept.-Oct. 2002)
Page(s): 82 - 91
Date of Publication: 07 November 2002

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