High-Speed Signal Jitter Measurement Method Based on Bit Error Rate Eye Diagram | IEEE Conference Publication | IEEE Xplore

High-Speed Signal Jitter Measurement Method Based on Bit Error Rate Eye Diagram


Abstract:

In the process of high-speed serial signal transmission, the performance of the entire system is often greatly affected due to the existence of jitters. Therefore, jitter...Show More

Abstract:

In the process of high-speed serial signal transmission, the performance of the entire system is often greatly affected due to the existence of jitters. Therefore, jitter has become a key factor restricting the design of high-speed digital systems [1]. This research proposes a technique to analyze jitter components using bit error rate eye diagrams. This technique is based on the generation principle of statistical eye diagrams, combined with the classification and decomposition method of jitter, and can be used to quickly extract and analyze each component of jitter. The bit error rate eye diagram data is obtained by using an experimental platform to generate a signal with a certain inherent jitter adjustable and send it to the receiving end of the platform through self-loopback. The data is analyzed to generate the corresponding bit error rate eye diagram (also called statistical eye diagram), and the probability density function (Probability density function, abbreviated as PDF) of the signal is obtained from the statistical eye diagram data. Based on the PDF analysis and calculation of the jitter signal, the random jitter (abbreviated as RJ) and the deterministic jitter (abbreviated as DJ) are separated, and the values of each component of the jitter are obtained. Compared with the set intrinsic jitter value, the jitter value calculated by this technique is within 7% error. Compared to an oscilloscope with the same bandwidth, this technique costs and consumes far less than an oscilloscope. Compared to an oscilloscope with the same bandwidth, this technique costs and consumes far less than an oscilloscope, and the results obtained are not very inaccurate.
Date of Conference: 09-11 August 2023
Date Added to IEEE Xplore: 10 October 2023
ISBN Information:
Conference Location: Harbin, China

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