Towards a TDD maturity model through an anti-patterns framework | IEEE Conference Publication | IEEE Xplore

Towards a TDD maturity model through an anti-patterns framework


Abstract:

Agile software development has been adopted in the industry to quickly react to business change. Since its inception both academia and industry debate the different shade...Show More

Abstract:

Agile software development has been adopted in the industry to quickly react to business change. Since its inception both academia and industry debate the different shades that agile processes and technical practices play in the day-to-day of students and professional developers. Efforts have been made to understand the pros and cons of the Test Driven Development (TDD) practice to develop software as part of a professional environment. Despite the effort of practitioners to list the TDD anti-patterns that unveil undesired effects in the code when practicing TDD, work is needed to understand the causes that lead to that. In that sense, this paper proposes a research project that explores the TDD anti-patterns context and what leads practitioners to face them in the software development context. As a result, we expect to offer a TDD maturity framework to help practitioners in the process of writing code guided by tests and prevent the addition of anti-patterns.
Date of Conference: 20-23 June 2023
Date Added to IEEE Xplore: 15 August 2023
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Conference Location: Aveiro, Portugal

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