MEMS Capacitance Diaphragm Gauge With Two Sealed Reference Cavities | IEEE Conference Publication | IEEE Xplore

MEMS Capacitance Diaphragm Gauge With Two Sealed Reference Cavities


Abstract:

A capacitance diaphragm gauge based on a glass-silicon-glass structure was designed to possessed two sealed reference cavities. Square pressure-sensing diaphragm with fou...Show More

Abstract:

A capacitance diaphragm gauge based on a glass-silicon-glass structure was designed to possessed two sealed reference cavities. Square pressure-sensing diaphragm with four corners chamfered was used as the sensitive element, and non-evaporation getter film was utilized to maintain the vacuum pressure in the reference cavities. The gauge with the size of 13×8×1.4 mm3 was manufactured by micromachining technology and its performance was studied systematically. Measurement rang, sensitivity and long-term stability of the gauge were tested and analyzed. The experimental results indicated that the gauge had an operating range of 1 to 8.5×105 Pa, and it can be used to measure accurate vacuum pressure ranging from 1 to 1000 Pa with a high sensitivity. Moreover, the long-term tests demonstrated that the gauge was stable enough for absolute vacuum pressure measurement.
Date of Conference: 15-19 January 2023
Date Added to IEEE Xplore: 01 March 2023
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Conference Location: Munich, Germany

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