Static Probability Analysis Guided RTL Hardware Trojan Test Generation | IEEE Conference Publication | IEEE Xplore

Static Probability Analysis Guided RTL Hardware Trojan Test Generation


Abstract:

Directed test generation is an effective method to detect potential hardware Trojan (HT) in RTL. While the existing works are able to activate hard-to-cover Trojans by co...Show More

Abstract:

Directed test generation is an effective method to detect potential hardware Trojan (HT) in RTL. While the existing works are able to activate hard-to-cover Trojans by covering security targets, the effectiveness and efficiency of identifying the targets to cover are ignored. We propose a static probability analysis method for identifying the hard-to-active data channel targets and generating the corresponding assertions for the HT test generation. Our method could generate test vectors to trigger Trojans from Trust-hub, DeTrust, and OpenCores in 1 minute and get 104.33X time improvement on average compared with the existing method.
Date of Conference: 16-19 January 2023
Date Added to IEEE Xplore: 23 February 2023
Electronic ISBN:978-1-4503-9783-4

ISSN Information:

Conference Location: Tokyo, Japan

Contact IEEE to Subscribe

References

References is not available for this document.