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Evaluation of Sampling Algorithms for a Pairwise Subjective Assessment Methodology | IEEE Conference Publication | IEEE Xplore

Evaluation of Sampling Algorithms for a Pairwise Subjective Assessment Methodology


Abstract:

Subjective assessment tests are often employed to evaluate image processing systems, notably image and video compression, super-resolution among others and have been used...Show More
Notes: This article was mistakenly omitted from the original submission to IEEE Xplore. It is now included as part of the conference record.

Abstract:

Subjective assessment tests are often employed to evaluate image processing systems, notably image and video compression, super-resolution among others and have been used as an indisputable way to provide evidence of the performance of an algorithm or system. While several methodologies can be used in a subjective quality assessment test, pairwise comparison tests are nowadays attracting a lot of attention due to their accuracy and simplicity. However, the number of comparisons in a pairwise comparison test increases quadratically with the number of stimuli and thus often leads to very long tests, which is impractical for many cases. However, not all the pairs contribute equally to the final score and thus, it is possible to reduce the number of comparisons without degrading the final accuracy. To do so, pairwise sampling methods are often used to select the pairs which provide more information about the quality of each stimuli. In this paper, a reliable and much-needed evaluation procedure is proposed and used for already available methods in the literature, especially considering the case of subjective evaluation of image and video codecs. The results indicate that an appropriate selection of the pairs allows to achieve very reliable scores while requiring the comparison of a much lower number of pairs.
Notes: This article was mistakenly omitted from the original submission to IEEE Xplore. It is now included as part of the conference record.
Date of Conference: 05-07 December 2022
Date Added to IEEE Xplore: 10 February 2023
ISBN Information:
Conference Location: Italy

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